The quantities of charges and CPD values are found to increase with the laser intensity and vary with the type of NRs. Though the exact mechanism for explaining the photogenerated effects of single Si NRs is not variable at present, it is clear that photoexcitation can lead to obvious charges trapped in Si NRs and hence reduce the work function of NRs. Therefore, EFM can provide an effective way to gain direct information on the trapped charges and surface potential of single nanostructures by combining with laser irradiation, which should be important for both basic understanding and potential applications of nanostructures in optoelectronics and photovoltaics. Acknowledgements This work was supported by
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